Transcatheter heart valve replacement is rapidly becoming a viable option for patients who present as high risk surgical candidates. The emergence of these devices has prompted a need to understand their long term structural integrity as a function of boundary conditions, material behavior, and device geometry assumptions. In the case of transcatheter replacement heart valves, there is a shortage of clinical data from which to derive accurate use conditions. Therefore, structural analysis of these devices is enhanced by using a stochastic, rather than deterministic, framework.

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