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Keywords: semiconductor melt
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Proceedings Papers

Proc. ASME. HT2003, Heat Transfer: Volume 1, 833-839, July 21–23, 2003
Paper No: HT2003-47448
... This study further develops the standard laser flash method for the measurement of multiple thermal properties of semiconductor melts. The standard laser flash method is widely used to measure thermal diffusivity of solids. Our modified procedure allows thermal diffusivity, thermal conductivity...