1-1 of 1
Keywords: semiconductor melt
Close
Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Proceedings Papers

Proc. ASME. HT2003, Heat Transfer: Volume 1, 833-839, July 21–23, 2003
Paper No: HT2003-47448
... This study further develops the standard laser flash method for the measurement of multiple thermal properties of semiconductor melts. The standard laser flash method is widely used to measure thermal diffusivity of solids. Our modified procedure allows thermal diffusivity, thermal conductivity...