Adhesive forces in microscale or nanoscale contact play a significant role in microelectromechanical systems (MEMS); scanning probe microscope (SPM) and some other related fields. In this paper, the relationship between the pull-off force and the transition parameter as well as the variation of the pull-off radius with the transition parameter is given. When hysteresis effect is considered, hysteresis models are presented to describe the contact radius as a function of external load in loading and unloading processes. Among these models, we verified the hysteresis model from JKR, which is in a good agreement with experiment. The parameter α of dissipated elastic energy can be measured through experiment.

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