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Proceedings Papers

Non-Enzymatic and Electrodeless Detection of Direct Bilirubin Using Metal Enhanced Fluorescence Effect

Cheng-Yi Li, Chang-I Peng, Sandy Huey-Jen Hsu, Cheng-Chung Chang, Gou-Jen Wang
Proc. ASME. IDETC-CIE2020, Volume 1: 14th International Conference on Micro- and Nanosystems (MNS), V001T01A001, August 17–19, 2020
Publisher: American Society of Mechanical Engineers
Paper No: DETC2020-22022
https://doi.org/10.1115/DETC2020-22022
View Paper titled, Non-Enzymatic and Electrodeless Detection of Direct Bilirubin Using Metal Enhanced Fluorescence Effect
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Topics: Enzymes, Fluorescence, Metals, Nanowires
Proceedings Papers

A Novel and Simple Electrochemical Glucose Biosensor Based on a Silicon Nanowire Array Electrode

Che-Wei Hsu, Wen-Chao Feng, Kang J. Chang, Gou-Jen Wang
Proc. ASME. IDETC-CIE2014, Volume 4: 19th Design for Manufacturing and the Life Cycle Conference; 8th International Conference on Micro- and Nanosystems, V004T09A003, August 17–20, 2014
Publisher: American Society of Mechanical Engineers
Paper No: DETC2014-34843
https://doi.org/10.1115/DETC2014-34843
View Paper titled, A Novel and Simple Electrochemical Glucose Biosensor Based on a Silicon Nanowire Array Electrode
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Topics: Biosensors, Electrodes, Glucose, Nanowires, Silicon, Currents, Etching, Glucose sensing, Manufacturing, Metals
Proceedings Papers

The Effects of Geometric Asymmetry on the Dynamic Response of Silicon Nanowires

Molly R. Nelis, Jeffrey F. Rhoads, Saeed Mohammadi
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 159-166, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47978
https://doi.org/10.1115/DETC2011-47978
View Paper titled, The Effects of Geometric Asymmetry on the Dynamic Response of Silicon Nanowires
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Topics: Dynamic response, Nanowires, Silicon, Resonance, Frequency response, Boundary-value problems, Design, Geometry, Materials properties, Nanotubes
Proceedings Papers

Towards MEMS Tester for Measuring Metal Nanofilm’s Lorenz Number

Weihe Xu, Qi Chen, Yong Shi
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 397-399, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47681
https://doi.org/10.1115/DETC2011-47681
View Paper titled, Towards MEMS Tester for Measuring Metal Nanofilm’s Lorenz Number
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Topics: Metals, Microelectromechanical systems, Thin films, Dimensions, Errors, Heating, Nanoscale phenomena, Nanowires, Simulation, Size effect
Proceedings Papers

Enhanced Topographical Characterization of Sharp Step Edges With Simultaneous AFM Imaging and Force Spectroscopy

Santiago D. Solares
Proc. ASME. IDETC-CIE2010, Volume 4: 12th International Conference on Advanced Vehicle and Tire Technologies; 4th International Conference on Micro- and Nanosystems, 461-467, August 15–18, 2010
Publisher: American Society of Mechanical Engineers
Paper No: DETC2010-28099
https://doi.org/10.1115/DETC2010-28099
View Paper titled, Enhanced Topographical Characterization of Sharp Step Edges With Simultaneous AFM Imaging and Force Spectroscopy
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Topics: Atomic force microscopy, Imaging, Spectroscopy, Membrane electrode assemblies, Carbon nanotubes, Engineering simulation, Inventions, Nanowires, Probes, Simulation
Proceedings Papers

Electrical Characterization of Single Carbon Nanowires

B. A. Samuel, M. A. Haque
Proc. ASME. IDETC-CIE2008, Volume 4: 20th International Conference on Design Theory and Methodology; Second International Conference on Micro- and Nanosystems, 849-853, August 3–6, 2008
Publisher: American Society of Mechanical Engineers
Paper No: DETC2008-50115
https://doi.org/10.1115/DETC2008-50115
View Paper titled, Electrical Characterization of Single Carbon Nanowires
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Topics: Carbon, Nanowires, Carbon nanotubes, Electrodes, Electron transport, Experimental characterization, Flexible electronics, Sensors
Proceedings Papers

Zero-Load Friction at Nanowire-Silicon Interfaces

Mohan Manoharan, Aman Haque
Proc. ASME. IDETC-CIE2008, Volume 4: 20th International Conference on Design Theory and Methodology; Second International Conference on Micro- and Nanosystems, 535-538, August 3–6, 2008
Publisher: American Society of Mechanical Engineers
Paper No: DETC2008-49818
https://doi.org/10.1115/DETC2008-49818
View Paper titled, Zero-Load Friction at Nanowire-Silicon Interfaces
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Topics: Adhesion, Friction, Nanowires, Silicon, Stress
Proceedings Papers

Polymer Coated Tin Oxide Nanowires for Improved Sensitivity of MEMS Chemical Sensors Based on Microbeams

Mark A. Zielke, Andrew Morrill, Barry Demartini, Martin Moskovits, Kimberly Turner
Proc. ASME. IDETC-CIE2008, Volume 4: 20th International Conference on Design Theory and Methodology; Second International Conference on Micro- and Nanosystems, 599-604, August 3–6, 2008
Publisher: American Society of Mechanical Engineers
Paper No: DETC2008-49843
https://doi.org/10.1115/DETC2008-49843
View Paper titled, Polymer Coated Tin Oxide Nanowires for Improved Sensitivity of MEMS Chemical Sensors Based on Microbeams
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Topics: Microbeams, Microelectromechanical systems, Nanowires, Polymers, Sensors, Coatings, Cantilevers, Catalysts, Chemical vapor deposition, Q-factor
Proceedings Papers

Effect of Electromechanical Coupling on the Young’s Modulus of Zinc Oxide Nanowires

A. V. Desai, M. A. Haque
Proc. ASME. IDETC-CIE2008, Volume 4: 20th International Conference on Design Theory and Methodology; Second International Conference on Micro- and Nanosystems, 553-559, August 3–6, 2008
Publisher: American Society of Mechanical Engineers
Paper No: DETC2008-49911
https://doi.org/10.1115/DETC2008-49911
View Paper titled, Effect of Electromechanical Coupling on the Young’s Modulus of Zinc Oxide Nanowires
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Topics: Nanowires, Young's modulus
Proceedings Papers

Nanomechanical Peeling of Carbon Nanotubes and Nanocoils Studied Using the Atomic Force Microscope

Mark C. Strus, Arvind Raman, Luis Zalamea, R. Byron Pipes
Proc. ASME. IDETC-CIE2008, Volume 4: 20th International Conference on Design Theory and Methodology; Second International Conference on Micro- and Nanosystems, 775-781, August 3–6, 2008
Publisher: American Society of Mechanical Engineers
Paper No: DETC2008-50020
https://doi.org/10.1115/DETC2008-50020
View Paper titled, Nanomechanical Peeling of Carbon Nanotubes and Nanocoils Studied Using the Atomic Force Microscope
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Topics: Atomic force microscopy, Carbon nanotubes, Nanotubes, Adhesion, Nanocomposites, Physics, Coatings, Fibers, Modeling, Nanoelectronics
Proceedings Papers

Nanomechanics of Peeling Studied Using the Atomic Force Microscope

Mark C. Strus, Arvind Raman, Luis Zalamea, R. Byron Pipes, Cattien V. Nguyen
Proc. ASME. IDETC-CIE2007, Volume 3: 19th International Conference on Design Theory and Methodology; 1st International Conference on Micro- and Nanosystems; and 9th International Conference on Advanced Vehicle Tire Technologies, Parts A and B, 627-632, September 4–7, 2007
Publisher: American Society of Mechanical Engineers
Paper No: DETC2007-34570
https://doi.org/10.1115/DETC2007-34570
View Paper titled, Nanomechanics of Peeling Studied Using the Atomic Force Microscope
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Topics: Atomic force microscopy, Nanotubes, Bending (Stress), Adhesion, DNA, Fracture (Materials), Friction, Multi-walled carbon nanotubes, Nanofibers, Nanoscale phenomena
Proceedings Papers

Algorithms for Extraction of Nanowires Attributes From Optical Section Microscopy Images

Tao Peng, Arvind Balijepalli, Satyandra K. Gupta, Thomas W. LeBrun
Proc. ASME. IDETC-CIE2007, Volume 2: 27th Computers and Information in Engineering Conference, Parts A and B, 279-290, September 4–7, 2007
Publisher: American Society of Mechanical Engineers
Paper No: DETC2007-35456
https://doi.org/10.1115/DETC2007-35456
View Paper titled, Algorithms for Extraction of Nanowires Attributes From Optical Section Microscopy Images
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Topics: Algorithms, Microscopy, Nanowires, Manufacturing, Blocks (Building materials), Brownian motion, Feature extraction, Nanoscale devices
Proceedings Papers

Algorithms for On-Line Monitoring of Components in an Optical Tweezers-Based Assembly Cell

Tao Peng, Arvind Balijepalli, Satyandra K. Gupta, Thomas W. LeBrun
Proc. ASME. IDETC-CIE2006, Volume 3: 26th Computers and Information in Engineering Conference, 297-309, September 10–13, 2006
Publisher: American Society of Mechanical Engineers
Paper No: DETC2006-99546
https://doi.org/10.1115/DETC2006-99546
View Paper titled, Algorithms for On-Line Monitoring of Components in an Optical Tweezers-Based Assembly Cell
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Topics: Algorithms, Manufacturing, Microscale devices, Microscopy, Nanoscale phenomena, Nanowires