During the last decade there has been a great progress in the field of inorganic and organic hybrid material development and characterization techniques. Mechanical, optical and electrical properties of these hybrid materials heavily depend upon the percentage composition of inorganic and organic components of these hybrid materials [1–3]. Generally, inorganic particle distribution in the organic polymer is characterized using Scanning Electron Microscopy. In this paper we introduce an optics based technique for composite materials characterization. In our research, Titania pigments are used in molding compounds to improve opacity by increasing scattering efficiency of the medium. The light scattering efficiency of the samples is found to be increasing with the addition of Titania particles in the base polymer. This systematic increase of light scattering is attributed to the surface morphology, variation of refractive index due to addition of Titania particles.
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ASME 2008 International Mechanical Engineering Congress and Exposition
October 31–November 6, 2008
Boston, Massachusetts, USA
Conference Sponsors:
- ASME
ISBN:
978-0-7918-4874-6
PROCEEDINGS PAPER
Characterization of a New Titanium Dioxide-Polymer Nanocomposite Material for Electronic Packaging Using Light Scattering Spectroscopy
M. A. Zimmerman,
M. A. Zimmerman
Tufts University, Medford, MA
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I. Georgakoudi
I. Georgakoudi
Tufts University, Medford, MA
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B. R. Dantal
Tufts University, Medford, MA
S. Gupta
Tufts University, Medford, MA
A. Saigal
Tufts University, Medford, MA
M. A. Zimmerman
Tufts University, Medford, MA
I. Georgakoudi
Tufts University, Medford, MA
Paper No:
IMECE2008-69194, pp. 1147-1150; 4 pages
Published Online:
August 26, 2009
Citation
Dantal, BR, Gupta, S, Saigal, A, Zimmerman, MA, & Georgakoudi, I. "Characterization of a New Titanium Dioxide-Polymer Nanocomposite Material for Electronic Packaging Using Light Scattering Spectroscopy." Proceedings of the ASME 2008 International Mechanical Engineering Congress and Exposition. Volume 13: Nano-Manufacturing Technology; and Micro and Nano Systems, Parts A and B. Boston, Massachusetts, USA. October 31–November 6, 2008. pp. 1147-1150. ASME. https://doi.org/10.1115/IMECE2008-69194
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