By directly solving the prescribed differential equations, an analytical method based on the cohesive model has been developed to investigate the interfacial debonding process induced by lithiation in an axisymmetric thin film electrode where an elastic active layer is bonded on a rigid substrate. The assumption of rigid substrate has been proved acceptable for high-modulus substrates such as copper and aluminum which are common materials for current collectors in lithium-ion batteries. For the case where the weak interface is assumed and the radial concentration gradient is neglected, an extremely simplified solution has been obtained. The simplified solution which has acceptable accuracy provides a good guidance for understanding and predicting the interfacial debonding.
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December 2016
Research-Article
Analytical Model on Lithiation-Induced Interfacial Debonding of an Active Layer From a Rigid Substrate
Bo Lu,
Bo Lu
Shanghai Institute of Applied
Mathematics and Mechanics,
Shanghai University,
Shanghai 200072, China
e-mail: riverbug@t.shu.edu.cn
Mathematics and Mechanics,
Shanghai University,
Shanghai 200072, China
e-mail: riverbug@t.shu.edu.cn
Search for other works by this author on:
Yanfei Zhao,
Yanfei Zhao
Materials Genome Institute,
Shanghai University,
Shanghai 200444, China;
Shanghai Institute of Applied
Mathematics and Mechanics,
Shanghai University,
Shanghai 200072, China
e-mail: yfzhao50@sina.com
Shanghai University,
Shanghai 200444, China;
Shanghai Institute of Applied
Mathematics and Mechanics,
Shanghai University,
Shanghai 200072, China
e-mail: yfzhao50@sina.com
Search for other works by this author on:
Yicheng Song,
Yicheng Song
Department of Mechanics,
Shanghai Key Laboratory of
Mechanics in Energy Engineering,
Shanghai University,
Shanghai 200444, China
e-mail: ycsong@shu.edu.cn
Mechanics in Energy Engineering,
Shanghai University,
Shanghai 200444, China
e-mail: ycsong@shu.edu.cn
Search for other works by this author on:
Junqian Zhang
Junqian Zhang
Department of Mechanics,
Materials Genome Institute,
Shanghai Key Laboratory of
Mechanics in Energy Engineering,
Shanghai University,
Shanghai 200444, China
e-mail: jqzhang2@shu.edu.cn
Mechanics in Energy Engineering,
Shanghai University,
Shanghai 200444, China
e-mail: jqzhang2@shu.edu.cn
Search for other works by this author on:
Bo Lu
Shanghai Institute of Applied
Mathematics and Mechanics,
Shanghai University,
Shanghai 200072, China
e-mail: riverbug@t.shu.edu.cn
Mathematics and Mechanics,
Shanghai University,
Shanghai 200072, China
e-mail: riverbug@t.shu.edu.cn
Yanfei Zhao
Materials Genome Institute,
Shanghai University,
Shanghai 200444, China;
Shanghai Institute of Applied
Mathematics and Mechanics,
Shanghai University,
Shanghai 200072, China
e-mail: yfzhao50@sina.com
Shanghai University,
Shanghai 200444, China;
Shanghai Institute of Applied
Mathematics and Mechanics,
Shanghai University,
Shanghai 200072, China
e-mail: yfzhao50@sina.com
Yicheng Song
Department of Mechanics,
Shanghai Key Laboratory of
Mechanics in Energy Engineering,
Shanghai University,
Shanghai 200444, China
e-mail: ycsong@shu.edu.cn
Mechanics in Energy Engineering,
Shanghai University,
Shanghai 200444, China
e-mail: ycsong@shu.edu.cn
Junqian Zhang
Department of Mechanics,
Materials Genome Institute,
Shanghai Key Laboratory of
Mechanics in Energy Engineering,
Shanghai University,
Shanghai 200444, China
e-mail: jqzhang2@shu.edu.cn
Mechanics in Energy Engineering,
Shanghai University,
Shanghai 200444, China
e-mail: jqzhang2@shu.edu.cn
1Corresponding author.
Contributed by the Applied Mechanics Division of ASME for publication in the JOURNAL OF APPLIED MECHANICS. Manuscript received June 28, 2016; final manuscript received September 15, 2016; published online October 5, 2016. Assoc. Editor: Kyung-Suk Kim.
J. Appl. Mech. Dec 2016, 83(12): 121009 (8 pages)
Published Online: October 5, 2016
Article history
Received:
June 28, 2016
Revised:
September 15, 2016
Citation
Lu, B., Zhao, Y., Song, Y., and Zhang, J. (October 5, 2016). "Analytical Model on Lithiation-Induced Interfacial Debonding of an Active Layer From a Rigid Substrate." ASME. J. Appl. Mech. December 2016; 83(12): 121009. https://doi.org/10.1115/1.4034783
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