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Keywords: atomic force microscopy
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Journal Articles

Influence of Local Material Properties on the Nonlinear Dynamic Behavior of an Atomic Force Microscope Probe

Wei Huang, Andrew J. Dick
Journal: Journal of Computational and Nonlinear Dynamics
Article Type: Research Papers
J. Comput. Nonlinear Dynam. October 2011, 6(4): 041009.
https://doi.org/10.1115/1.4003732
Published Online: April 14, 2011
... Microscopy Methods ,” Meas. Sci. Technol. 0957-0233 , 16 ( 11 ), pp. 2167 – 2172 . 10.1088/0957-0233/16/11/006 Giessibl , F. J. , 2001 , “ A Direct Method to Calculate Tip–Sample Forces From Frequency Shifts in Frequency-Modulation Atomic Force Microscopy ,” Appl. Phys. Lett. 0003-6951...
View Article titled, Influence of Local Material Properties on the Nonlinear Dynamic Behavior of an Atomic Force Microscope Probe
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Topics: Atomic force microscopy, Bifurcation, Cantilevers, Excitation, Probes, Separation (Technology), Simulation, Materials properties, Stiffness
Journal Articles

Utilizing Off-Resonance and Dual-Frequency Excitation to Distinguish Attractive and Repulsive Surface Forces in Atomic Force Microscopy

Andrew J. Dick, Santiago D. Solares
Journal: Journal of Computational and Nonlinear Dynamics
Article Type: Research Papers
J. Comput. Nonlinear Dynam. July 2011, 6(3): 031005.
https://doi.org/10.1115/1.4002341
Published Online: December 16, 2010
... and continuation software is employed ( 42 ). Previous studies have demonstrated that AUTO and the pseudo-arc-length continuation methods that it employs have great potential for studying nonlinear dynamics in intermittent contact mode atomic force microscopy for various tip-sample interaction force models ( 43...
View Article titled, Utilizing Off-Resonance and Dual-Frequency Excitation to Distinguish Attractive and Repulsive Surface Forces in <span class="search-highlight">Atomic</span> <span class="search-highlight">Force</span> <span class="search-highlight">Microscopy</span>
Open the PDF for Utilizing Off-Resonance and Dual-Frequency Excitation to Distinguish Attractive and Repulsive Surface Forces in <span class="search-highlight">Atomic</span> <span class="search-highlight">Force</span> <span class="search-highlight">Microscopy</span> in another window
Topics: Atomic force microscopy, Excitation, Probes, Separation (Technology), Resonance, Cantilevers
Journal Articles

Discontinuity-Induced Bifurcations in Systems With Hysteretic Force Interactions

Harry Dankowicz, Mark R. Paul
Journal: Journal of Computational and Nonlinear Dynamics
Article Type: Research Papers
J. Comput. Nonlinear Dynam. October 2009, 4(4): 041009.
https://doi.org/10.1115/1.3192131
Published Online: August 25, 2009
...)00161-X Lee , S. I. , Howell , S. W. , Raman , A. , and Reifenberger , R. , 2002 , “ Nonlinear Dynamics of Microcantilevers in Tapping Mode Atomic Force Microscopy: A Comparison Between Theory and Experiment ,” Phys. Rev. B 0163-1829 , 66 ( 11 ), p. 115409 . 10.1103...
View Article titled, Discontinuity-Induced Bifurcations in Systems With Hysteretic Force Interactions
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Topics: Atomic force microscopy, Bifurcation, Cantilevers, Dynamic systems, Dynamics (Mechanics), Eigenvalues, Poincaré maps, Trajectories (Physics)
Journal Articles

Characterization of Intermittent Contact in Tapping-Mode Atomic Force Microscopy

Xiaopeng Zhao, Harry Dankowicz
Journal: Journal of Computational and Nonlinear Dynamics
Article Type: Research Papers
J. Comput. Nonlinear Dynam. April 2006, 1(2): 109–115.
https://doi.org/10.1115/1.2162864
Published Online: September 4, 2005
...Xiaopeng Zhao; Harry Dankowicz Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and subsurface properties of a variety of materials in a variety of environments. Strongly nonlinear effects due to large variations in the force field on the probe tip over...
View Article titled, Characterization of Intermittent Contact in Tapping-Mode <span class="search-highlight">Atomic</span> <span class="search-highlight">Force</span> <span class="search-highlight">Microscopy</span>
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Topics: Atomic force microscopy, Bifurcation, Cantilevers, Oscillations, Stability, Dynamic systems, Trajectories (Physics), Separation (Technology), Dynamics (Mechanics)