Large-scale automated assembly systems are widely used in automotive, aerospace and consumer electronics industries to obtain high quality products in less time. However, one disadvantage of these automated systems is that they are composed of too many working parameters. Since it is not possible to monitor all these parameters during the assembly process, an undetected error may propagate and result in a more critical detected error. In this paper, a unique way of detecting and diagnosing these types of failures by using Virtual Factories is discussed. A Virtual Factory was developed by building and linking several software modules to predict and diagnose propagated errors. A multi-station assembly system was modeled and a previously discussed “off-line prediction and recovery” method was applied. The obtained results showed that this method is capable of predicting propagated errors, which are too complex to solve for a human expert.
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e-mail: cem-baydar@accentuate.com
e-mail: kazu@umich.edu
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September 2001
Application Briefs
Prediction and Diagnosis of Propagated Errors in Assembly Systems Using Virtual Factories
Cem M. Baydar,
e-mail: cem-baydar@accentuate.com
Cem M. Baydar
Accenture Technology Labs, 3773 Willow Rd., Northbrook, IL 60062-6212
11
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Kazuhiro Saitou, Assist. Prof.
e-mail: kazu@umich.edu
Kazuhiro Saitou, Assist. Prof.
Department of Mechanical Engineering, University of Michigan, Ann Arbor, MI 48109-2125
Search for other works by this author on:
Cem M. Baydar
11
Accenture Technology Labs, 3773 Willow Rd., Northbrook, IL 60062-6212
e-mail: cem-baydar@accentuate.com
Kazuhiro Saitou, Assist. Prof.
Department of Mechanical Engineering, University of Michigan, Ann Arbor, MI 48109-2125
e-mail: kazu@umich.edu
J. Comput. Inf. Sci. Eng. Sep 2001, 1(3): 261-265 (5 pages)
Published Online: August 1, 2001
Article history
Received:
April 1, 2001
Revised:
August 1, 2001
Citation
Baydar, C. M., and Saitou , K. (August 1, 2001). "Prediction and Diagnosis of Propagated Errors in Assembly Systems Using Virtual Factories ." ASME. J. Comput. Inf. Sci. Eng. September 2001; 1(3): 261–265. https://doi.org/10.1115/1.1411966
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