Diagnosis of complex engineering systems requires the use of multiple sensor sources to acquire information. In this paper we present a survey of multimodal data acquisition systems for nondestructive testing (NDT) and engineering analysis. We begin with a summary of the relative strengths and weaknesses of individual NDT modalities. Thereafter we present existing multimodal inspection hardware systems that use complementary NDT sensors. The advantages of such multimodal data acquisition over conventional single modality sensors in inspection and analysis are highlighted. Possible approaches to fuse complementary multimodal sensor data are discussed. We conclude with possible directions for the future development of multimodal inspection systems.
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March 2007
Technology Review
Multimodal Industrial Inspection and Analysis
Prabhjot Singh,
Prabhjot Singh
Product Realization Lab,
GE Global Research
, One Research Circle, Niskayuna, NY 12309
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Yanyan Wu,
Yanyan Wu
Product Realization Lab,
e-mail: wuy@research.ge.com
GE Global Research
, One Research Circle, Niskayuna, NY 12309
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Robert Kaucic,
Robert Kaucic
Computer Vision Lab,
GE Global Research
, One Research Circle, Niskayuna, NY 12309
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Jiaqin Chen,
Jiaqin Chen
Computer Sciences Department,
University of Wisconsin
, Madison, WI 53706
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Francis Little
Francis Little
General Electric Transportation
, Quality Technology Center, 10270 St. Rita Lane, Cincinnati, OH 45215
Search for other works by this author on:
Prabhjot Singh
Product Realization Lab,
GE Global Research
, One Research Circle, Niskayuna, NY 12309
Yanyan Wu
Product Realization Lab,
GE Global Research
, One Research Circle, Niskayuna, NY 12309e-mail: wuy@research.ge.com
Robert Kaucic
Computer Vision Lab,
GE Global Research
, One Research Circle, Niskayuna, NY 12309
Jiaqin Chen
Computer Sciences Department,
University of Wisconsin
, Madison, WI 53706
Francis Little
General Electric Transportation
, Quality Technology Center, 10270 St. Rita Lane, Cincinnati, OH 45215J. Comput. Inf. Sci. Eng. Mar 2007, 7(1): 102-107 (6 pages)
Published Online: September 5, 2006
Article history
Received:
September 15, 2005
Revised:
September 5, 2006
Citation
Singh, P., Wu, Y., Kaucic, R., Chen, J., and Little, F. (September 5, 2006). "Multimodal Industrial Inspection and Analysis." ASME. J. Comput. Inf. Sci. Eng. March 2007; 7(1): 102–107. https://doi.org/10.1115/1.2410024
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