The Low Temperature Transient Liquid Phase Diffusion Bonding (LTTLP) process has been used to reduce the residual stresses and hence, improve the thermal fatigue performance of bonds between dissimilar electronic packaging materials. Aluminum oxide plated with either gold or copper has been bonded to copper heatsinks at temperatures less than 160°C, using In-Sn eutectic solders. After two hours at the bonding temperature, Cu/In-Sn/Cu joints exhibit a remit temperature in excess of 470°C and provide static strengths up to four times greater than the original solder bonds. Au/In-Sn/Cu joints do not exhibit a high remit temperature due to the formation of a stable Au-In-Sn phase which melts below 130°C. Both types of joints exhibited acceptable thermal fatigue performance for the conditions which were studied.
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December 1992
Research Papers
Low Temperature Transient Liquid Phase (LTTLP) Bonding for Au/Cu and Cu/Cu Interconnections
M. M. Hou,
M. M. Hou
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
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Thomas W. Eagar
Thomas W. Eagar
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
Search for other works by this author on:
M. M. Hou
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
Thomas W. Eagar
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
J. Electron. Packag. Dec 1992, 114(4): 443-447 (5 pages)
Published Online: December 1, 1992
Article history
Received:
July 15, 1992
Revised:
September 29, 1992
Online:
April 28, 2008
Citation
Hou, M. M., and Eagar, T. W. (December 1, 1992). "Low Temperature Transient Liquid Phase (LTTLP) Bonding for Au/Cu and Cu/Cu Interconnections." ASME. J. Electron. Packag. December 1992; 114(4): 443–447. https://doi.org/10.1115/1.2905478
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