Flip-Chip connections using gold-to-gold, gold-to-aluminum, or gold-to-solder bondings or contacts enhanced by epoxy are low-cost alternatives to soldering. To assist their technology advancements, we have developed yield models for a representative assembly process with flip-chip, thermocompression bondings. Based on bonding mechanics, a physical yield model has been developed to characterize the process. Then, a fuzzy logic model has been established to improve the modeling’s accuracy by including experimental data. The physical yield model can predict the assembly yield as a function of forces and planarities of the end effector, bump height variations, bump geometries, mechanical properties corresponding to different materials and temperatures, and distribution patterns of bumps. Consistent with our experimental experience, the calculated force level for a high-yield process was around 3000 gmf for a 30-gold-bump chip with a bump diameter of 60 μm and a height of 50 μm. The fuzzy logic model can be trained and adjusted by the results of physical models and experiments. It correlates very well to the nonlinear relationships between the yield and the assembly parameters, and has a self-learning capability to update itself with new data. Such capabilities have been demonstrated by studying the bonding on a substrate with or without a compliant layer.
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March 1993
Research Papers
Physical and Fuzzy Logic Modeling of a Flip-Chip Thermocompression Bonding Process
Sa-Yoon Kang,
Sa-Yoon Kang
Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309-0427
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H. Xie,
H. Xie
Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309-0427
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Y. C. Lee
Y. C. Lee
Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309-0427
Search for other works by this author on:
Sa-Yoon Kang
Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309-0427
H. Xie
Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309-0427
Y. C. Lee
Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309-0427
J. Electron. Packag. Mar 1993, 115(1): 63-70 (8 pages)
Published Online: March 1, 1993
Article history
Received:
June 15, 1992
Revised:
December 30, 1992
Online:
April 28, 2008
Citation
Kang, S., Xie, H., and Lee, Y. C. (March 1, 1993). "Physical and Fuzzy Logic Modeling of a Flip-Chip Thermocompression Bonding Process." ASME. J. Electron. Packag. March 1993; 115(1): 63–70. https://doi.org/10.1115/1.2909303
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