Surface mount components soldered with 58Bi–42Sn on printed circuit boards fell off after about 500 cycles of−45°C ↔ 100°C in a thermal chamber. Failure analysis revealed that the failure was caused by dissolving of Pb from either HAL (hot air leveled) board surfaces or component lead coatings into the Bi-Sn solder joints, forming 52Bi–32Pb–16Sn eutectic phase that melts at 95°C. The dissolving of Pb occurred primarily at reflow, when the Bi-Sn was molten. During the thermal cycling, the small amount (<7 volume % of a Bi-Sn solder joint) of the low melting eutectic phase provided liquid channels for fast atom transportation, causing exceptionally significant grain growth and phase agglomeration in the whole volume of the solder joint, which in turn caused dramatic reduction in mechanical strength of the solder joints. Solutions to the failure may be either using Pb-free coating on both board surfaces and component leads, or limiting the product service temperature to below 95°C.
Skip Nav Destination
Article navigation
June 1996
Technical Papers
A Thermal Fatigue Failure Mechanism of 58Bi-42Sn Solder Joints
Zequn Mei,
Zequn Mei
Electronic Assembly Development Center, Hewlett-Packard Company, 1501 Page Mill Road, Palo Alto, CA 94034
Search for other works by this author on:
Helen Holder
Helen Holder
Electronic Assembly Development Center, Hewlett-Packard Company, 1501 Page Mill Road, Palo Alto, CA 94034
Search for other works by this author on:
Zequn Mei
Electronic Assembly Development Center, Hewlett-Packard Company, 1501 Page Mill Road, Palo Alto, CA 94034
Helen Holder
Electronic Assembly Development Center, Hewlett-Packard Company, 1501 Page Mill Road, Palo Alto, CA 94034
J. Electron. Packag. Jun 1996, 118(2): 62-66 (5 pages)
Published Online: June 1, 1996
Article history
Received:
January 1, 1996
Revised:
March 1, 1996
Online:
November 6, 2007
Citation
Mei, Z., and Holder, H. (June 1, 1996). "A Thermal Fatigue Failure Mechanism of 58Bi-42Sn Solder Joints." ASME. J. Electron. Packag. June 1996; 118(2): 62–66. https://doi.org/10.1115/1.2792133
Download citation file:
Get Email Alerts
Impact of Encapsulated Phase Change Material Additives for Improved Thermal Performance of Silicone Gel Insulation
J. Electron. Packag (December 2024)
Special Issue on InterPACK2023
J. Electron. Packag
Extreme Drop Durability of Sintered Silver Traces Printed With Extrusion and Aerosol Jet Processes
J. Electron. Packag (December 2024)
Related Articles
Failure Analysis of No-Clean and Water-Clean Solder Joints 0.4 mm Pitch, 256-Pin Plastic Quad Flat Pack
J. Electron. Packag (September,1994)
Thermal Fatigue Damage in the Solder Joints of Leadless Chip Resistors
J. Electron. Packag (June,1994)
Isothermal Cyclic Bend Fatigue Test Method for Lead-Free Solder Joints
J. Electron. Packag (December,2007)
Creep in Shear of Experimental Solder Joints
J. Electron. Packag (June,1990)
Related Proceedings Papers
Related Chapters
Package-to-Board Interconnection
Essentials of Electronic Packaging: A Multidisciplinary Approach
New Guidelines on Assessing the Risk of Fatigue Failure and Remaining Life of Ageing Pressure Vessels:
Ageing and Life Extension of Offshore Facilities
Thermodynamic Performance
Closed-Cycle Gas Turbines: Operating Experience and Future Potential