This paper reviews the inherent change in the observed mechanical behavior of electronic components, structures, and multimaterials as a result of the ongoing miniaturization. In general, the size of microstructures is no longer negligible with respect to the component size in micro and submicron applications. Additionally, surface layers start to play a more prominent role in the mechanical response. Microstructural effects, macroscopically triggered gradient effects, and surface effects jointly appear and constitute the various size effects that can be observed. Classical continuum mechanics theories fail to describe these phenomena, and higher-order multiscale theories are required to arrive at an appropriate prediction of the mechanical behavior of miniaturized structures.
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September 2005
Research Papers
Multiscale Mechanics in Microelectronics: A Paradigm in Miniaturization
M. G. D. Geers,
M. G. D. Geers
Department of Mechanical Engineering,
e-mail: m.g.d.geers@tue.nl
Eindhoven University of Technology
, P.O. Box 513, 5600 MB Eindhoven, The Netherlands
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V. Kouznetsova,
V. Kouznetsova
Department of Mechanical Engineering,
Eindhoven University of Technology
, P.O. Box 513, 5600 MB Eindhoven, The Netherlands
Search for other works by this author on:
W. A. M. Brekelmans
W. A. M. Brekelmans
Department of Mechanical Engineering,
Eindhoven University of Technology
, P.O. Box 513, 5600 MB Eindhoven, The Netherlands
Search for other works by this author on:
M. G. D. Geers
Department of Mechanical Engineering,
Eindhoven University of Technology
, P.O. Box 513, 5600 MB Eindhoven, The Netherlandse-mail: m.g.d.geers@tue.nl
V. Kouznetsova
Department of Mechanical Engineering,
Eindhoven University of Technology
, P.O. Box 513, 5600 MB Eindhoven, The Netherlands
W. A. M. Brekelmans
Department of Mechanical Engineering,
Eindhoven University of Technology
, P.O. Box 513, 5600 MB Eindhoven, The NetherlandsJ. Electron. Packag. Sep 2005, 127(3): 255-261 (7 pages)
Published Online: June 24, 2004
Article history
Received:
February 3, 2003
Revised:
June 24, 2004
Citation
Geers, M. G. D., Kouznetsova, V., and Brekelmans, W. A. M. (June 24, 2004). "Multiscale Mechanics in Microelectronics: A Paradigm in Miniaturization." ASME. J. Electron. Packag. September 2005; 127(3): 255–261. https://doi.org/10.1115/1.1939007
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