A unified creep plasticity damage (UCPD) model for eutectic Sn-Pb and Pb-free solders was developed and implemented into finite element analysis codes. The new model will be described along with the relationship between the model's damage evolution equation and an empirical Coffin–Manson relationship for solder fatigue. Next, developments needed to model crack initiation and growth in solder joints will be described. Finally, experimentally observed cracks in typical solder joints subjected to thermal mechanical fatigue are compared with model predictions. Finite element based modeling is particularly suited for predicting solder joint fatigue of advanced electronics packaging, e.g. package-on-package (PoP), because it allows for evaluation of a variety of package materials and geometries.
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December 2014
Research-Article
UCPD Model for Pb-Free Solder
Michael K. Neilsen,
Michael K. Neilsen
Mem. ASME
e-mail: mkneils@sandia.gov
Sandia National Laboratories
,P.O. Box 5800, MS0346
,Albuquerque, NM 87185
e-mail: mkneils@sandia.gov
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Paul T. Vianco
Paul T. Vianco
Search for other works by this author on:
Michael K. Neilsen
Mem. ASME
e-mail: mkneils@sandia.gov
Sandia National Laboratories
,P.O. Box 5800, MS0346
,Albuquerque, NM 87185
e-mail: mkneils@sandia.gov
Paul T. Vianco
Contributed by the Electronic and Photonic Packaging Division of ASME for publication in the JOURNAL OF ELECTRONIC PACKAGING. Manuscript received September 9, 2013; final manuscript received February 6, 2014; published online September 19, 2014. Assoc. Editor: Satish Chaparala.
J. Electron. Packag. Dec 2014, 136(4): 041006 (8 pages)
Published Online: September 19, 2014
Article history
Received:
September 9, 2013
Revision Received:
February 6, 2014
Citation
Neilsen, M. K., and Vianco, P. T. (September 19, 2014). "UCPD Model for Pb-Free Solder." ASME. J. Electron. Packag. December 2014; 136(4): 041006. https://doi.org/10.1115/1.4026851
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