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Issues
June 1994
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Research Papers
Crack Propagation in Solder Joints During Thermal-Mechanical Cycling
J. Electron. Packag. June 1994, 116(2): 69–75.
doi: https://doi.org/10.1115/1.2905507
Topics:
Crack propagation
,
Solder joints
,
Failure
,
Creep
,
Cycles
,
Finite element analysis
,
Fracture (Materials)
,
Solders
,
Computer software
,
Cracking (Materials)
Experimental Analysis of Thermal Cycling Fatigue of Four-Layered FR4 Printed Wiring Boards
J. Electron. Packag. June 1994, 116(2): 76–82.
doi: https://doi.org/10.1115/1.2905508
Thermal Fatigue Damage in the Solder Joints of Leadless Chip Resistors
J. Electron. Packag. June 1994, 116(2): 83–88.
doi: https://doi.org/10.1115/1.2905509
Topics:
Fatigue damage
,
Resistors
,
Solder joints
,
Solders
,
Damage
,
Stress concentration
,
Corners (Structural elements)
,
Cracking (Materials)
,
Cycles
,
Design
Effects of Solder Joint Voiding and Seating Plane Stability on Surface Mount Lead Standoff
J. Electron. Packag. June 1994, 116(2): 89–91.
doi: https://doi.org/10.1115/1.2905510
Topics:
Solder joints
,
Stability
,
Surface mount packaging
,
Solders
,
Rocks
,
Surface mount technology
Local PWB and Component Bowing of an Assembly Subjected to a Bending Moment
J. Electron. Packag. June 1994, 116(2): 92–97.
doi: https://doi.org/10.1115/1.2905511
Topics:
Manufacturing
,
Printed circuit boards
,
Cross section (Physics)
,
Electronic components
,
Rotation
,
Stiffness
,
Stress
A Fractional-Factorial Numerical Technique for Stress Analysis of Glass-To-Metal Lead Seals
J. Electron. Packag. June 1994, 116(2): 98–104.
doi: https://doi.org/10.1115/1.2905512
Topics:
Glass
,
Metals
,
Stress analysis (Engineering)
,
Stress
,
Design
,
Experimental design
,
Fracture (Materials)
,
Fracture (Process)
,
Geometry
,
Simulation
The Effects of Adhesive Nonlinearity on Thermal Stress in Layered Components
J. Electron. Packag. June 1994, 116(2): 105–109.
doi: https://doi.org/10.1115/1.2905497
Topics:
Adhesives
,
Thermal stresses
,
Stress
,
Bonding
,
Materials properties
,
Stress-strain relations
,
Variational techniques
Elastic Analysis of Flip-Chip Solder Joints Undergoing Thermal Excursions
J. Electron. Packag. June 1994, 116(2): 110–115.
doi: https://doi.org/10.1115/1.2905498
Topics:
Elastic analysis
,
Flip-chip
,
Solder joints
,
Stress
,
Deformation
,
Thermodynamic power cycles
Immersion-Cooled Standard Electronic Clamshell Module: A Building Block for Future High-Flux Avionic Systems
J. Electron. Packag. June 1994, 116(2): 116–125.
doi: https://doi.org/10.1115/1.2905499
Topics:
Aluminum
,
Blocks (Building materials)
,
Boiling
,
Cavities
,
Condensed matter
,
Coolants
,
Cooling
,
Energy dissipation
,
Flow (Dynamics)
,
Hardware
Use of a Two-Dimensional Simulation Model in the Thermal Analysis of a Multi-Board Electronic Module
J. Electron. Packag. June 1994, 116(2): 126–133.
doi: https://doi.org/10.1115/1.2905500
Topics:
Simulation models
,
Thermal analysis
,
Heat transfer
,
Radiation (Physics)
,
Air flow
,
Convection
,
Drag (Fluid dynamics)
,
Geometry
,
Heat conduction
,
Heat losses
Thermal Model of a PC
J. Electron. Packag. June 1994, 116(2): 134–137.
doi: https://doi.org/10.1115/1.2905501
Topics:
Air flow
,
Computers
,
Convection
,
Cooling
,
Electronic packages
,
Flow (Dynamics)
,
Geometry
,
Modeling
,
Simulation
,
Temperature
Natural Convection Heat Transfer From an Array of Rectangular Protrusions in an Enclosure Filled With Dielectric Liquid
J. Electron. Packag. June 1994, 116(2): 138–147.
doi: https://doi.org/10.1115/1.2905502
Investigation of Thermomechanical Properties of Low Temperature Cofired Ceramic
J. Electron. Packag. June 1994, 116(2): 148–153.
doi: https://doi.org/10.1115/1.2905503
Technical Briefs
Bending and Twisting of 60Sn40Pb Solder Interconnects With Creep
J. Electron. Packag. June 1994, 116(2): 154–157.
doi: https://doi.org/10.1115/1.2905504
Topics:
Creep
,
Solders
,
Cylinders
,
Geometry
,
Materials properties
Influence of Surface Mount Lead End Geometry on Fatigue Life
J. Electron. Packag. June 1994, 116(2): 157–160.
doi: https://doi.org/10.1115/1.2905505
Topics:
Fatigue life
,
Geometry
,
Surface mount packaging
,
Shapes
,
Solder joints
,
Solders
,
Dimensions
,
Fatigue
,
Fatigue damage
,
Finite element analysis
Book Reviews
Taguchi on Robust Technology Development: Bringing Quality Engineering Upstream
J. Electron. Packag. June 1994, 116(2): 161.
doi: https://doi.org/10.1115/1.2905506
Topics:
Technology development
Email alerts
RSS Feeds
Sequential Versus Concurrent Effects in Combined Stress Solder Joint Reliability
J. Electron. Packag
Anand Model Constants of Sn-Ag-Cu Solders: What Do They Actually Mean?
J. Electron. Packag