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Keywords: interconnections
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Journal Articles
Article Type: Research Papers
J. Electron. Packag. December 2010, 132(4): 041013.
Published Online: December 8, 2010
...-alignment occurs in controlled collapse bonding when the solder interconnects become liquidus and, driven by surface tension, pull the chip into registration with the substrate. To study flip chip self-alignment in the presence of underfill, the viscous forces acting on the chip during realignment...
Journal Articles
Article Type: Research Papers
J. Electron. Packag. September 2009, 131(3): 031005.
Published Online: June 23, 2009
...Satoru Katsurayama; Hironori Tohmyoh In flip chip packages, it is common practice for interconnects to be encapsulated with a liquid underfill material. This paper describes the effects of different underfill processes, i.e., the conventional capillary-flow underfill and two no-flow underfill...
Journal Articles
Article Type: Technical Papers
J. Electron. Packag. March 2004, 126(1): 34–36.
Published Online: April 30, 2004
... conductivity material. High Density Interconnection is accomplished either by direct printing of 75 micron conductor traces or, for smaller dimensions, conductive ink deposited in specially “patterned” dielectric. (1) Since the electronic device is securely held in the pocket by the moulded substrate...
Journal Articles
Article Type: Technical Papers
J. Electron. Packag. March 2004, 126(1): 74–81.
Published Online: April 30, 2004
..., with both step-function and sinusoidal temperature histories being considered. The time-dependent effects in the array’s shear deformation are introduced in an approximate manner by modeling the interconnect material (solder) as a temperature-independent linear viscoelastic material. The viscoelastic...
Journal Articles
Article Type: Technical Papers
J. Electron. Packag. March 2004, 126(1): 82–86.
Published Online: April 30, 2004
...Naotaka Tanaka, Senior Researcher; Kenya Kawano, Researcher; Hideo Miura, Chief Researcher; Yoshiyuki Kado, Engineer; Ikuo Yoshida, Senior Engineer The interconnection reliability of a contact-joint structure with anisotropic conductive film (ACF) or non-conductive film (NCF) was evaluated in terms...
Journal Articles
Article Type: Technical Papers
J. Electron. Packag. December 2002, 124(4): 374–378.
Published Online: December 12, 2002
... and the interconnection as a result of high energy impact on an electronic equipment. Shear test was then performed to examine the change in strength of the ICA joints as a result of impact damage. It was found that the SM ICA joints failed due to impact at a strain rate just over 4000/s. Microstructural examination...
Journal Articles
Article Type: Papers On Reliability
J. Electron. Packag. June 2001, 123(2): 147–155.
Published Online: October 10, 2000
... circuit reliability stress analysis failure analysis finite element analysis thermal stress cracking viscoplasticity interconnections The challenging task in today’s fast paced electronics industry is to accurately assess the reliability at a minimal cost and time. Virtual qualification...
Journal Articles
Article Type: Book Reviews
J. Electron. Packag. June 2000, 122(2): 178–179.
Published Online: June 1, 2000
...Michael Pecht,, Editor; Anthony J. Rafanelli,, Reviewer [S1043-7398(00)01502-4] packaging reviews printed circuit design thermal management (packaging) interconnections electric connectors Book Review: Handbook of Electronic Package Design , edited by Michael Pecht, Marcel-Dekker...