Fabry-Perot resonators were built from two superconductive YBa2Cu3O7δ (YBCO) films separated by a spacer. Each film of 35-nm thickness was deposited on a Si substrate, about 204 μm thick. A slow-scan Michelson interferometer was employed to measure the transmittance of the resonator in the far-infrared frequency region from 10 to 90 cm1 at temperatures between 10 and 300 K. Measurements showed that in the normal state the peak (or resonant) transmittance decreases as temperature is lowered, whereas in the superconducting state it can increase with decreasing temperature. The transmittance of the resonator was calculated using properties of individual reflectors obtained previously. When the effect of partial coherence is taken into consideration, the calculated transmittance is in good agreement with the experiments. Furthermore, the maximum possible resonant transmittance was predicted based on an optimization analysis in which the cavity length is varied. The effect of the YBCO film thickness on the transmittance peaks was also studied, showing that the resonant transmittance decreases but the finesse increases as the film thickness is increased. This study should help improve the future design of Fabry-Perot resonators based on HTSC thin films. [S0022-1481(00)00604-6]

1.
Brodbeck
,
R.
,
Pepe
,
F. A.
,
Tognina
,
C.
,
Bhend
,
D.
,
Zimmerman
,
E.
, and
Kneubuhl
,
F. K.
,
1998
, “
Balloon-Borne Far-Infrared Fabry-Perot Spectrometers for Astrophysical Observations
,”
Infrared Physics and Technology
,
39
, pp.
393
414
.
2.
Vaughan, J. M., 1989, The Fabry-Perot Interferometer, Adam Hilger Publishers, Philadelphia, PA.
3.
Komm
,
D. S.
,
Blanken
,
R. A.
, and
Brossier
,
P.
,
1975
, “
Fast-Scanning Far-Infrared Fabry-Perot Interferometer
,”
Appl. Opt.
,
14
, pp.
460
464
.
4.
Renk
,
K. F.
, and
Genzel
,
L.
,
1962
, “
Interference Filters and Fabry-Perot Interferometers for the Far Infrared
,”
Appl. Opt.
,
1
, pp.
643
648
.
5.
Belland
,
P.
, and
Lecullier
,
J. C.
,
1980
, “
Scanning Fabry-Perot Interferometer: Performance and Optimum Use in the Far Infrared Range
,”
Appl. Opt.
,
19
, pp.
1946
1952
.
6.
Renk
,
K. F.
,
Betz
,
J.
,
Schu¨tzmann
,
J.
,
Pru¨ckl
,
A.
,
Brunner
,
B.
, and
Lengfellner
,
H.
,
1990
, “
Use of High Tc Superconductors for Far-Infrared Fabry-Perot Resonators
,”
Appl. Phys. Lett.
,
57
, pp.
2148
2149
.
7.
Wiese
,
P.
,
Riederer
,
X.
,
Schu¨tzmann
,
J.
,
Gorshunov
,
B.
,
Betz
,
J.
, and
Renk
,
K. F.
,
1992
, “
Far-Infrared Fabry Perot Filter of High Transmission With High-Tc Superconductor Reflectors
,”
Int. J. Infrared Millim. Waves
,
13
, pp.
65
70
.
8.
Pechen
,
E. V.
,
Vent
,
S.
,
Brunner
,
B.
,
Pru¨ckl
,
A.
,
Lipp
,
S.
,
Linder
,
G.
,
Alexandrov
,
O.
,
Schu¨tzmann
,
J.
, and
Renk
,
K. F.
,
1992
, “
Far-Infrared Fabry-Perot Resonator With High Tc YBa2Cu3O7−δ Films on Silicon Plates
,”
Appl. Phys. Lett.
,
61
, pp.
1980
1982
.
9.
Malone
,
C. G.
,
Zhang
,
Z. M.
,
Flik
,
M. I.
, and
Cravalho
,
E. G.
,
1993
, “
Optimized Design of Far-Infrared Fabry-Perot Resonators Fabricated From YBa2Cu3O7,
IEEE Trans. Appl. Supercond.
,
3
, pp.
2852
2855
.
10.
Kumar, A. R., and Zhang, Z. M., 1999, “Far-Infrared Spectroscopy of High-Temperature Superconducting Films on Silicon Substrates,” Recent Research Developments in Applied Spectroscopy, Vol. 2, S. G. Pandalai, ed., Research Signpost, India, pp. 99–112.
11.
Rice
,
J. P.
,
Grossman
,
E. N.
, and
Rudman
,
D. A.
,
1994
, “
Antenna-Coupled High-Tc Air-Bridge Microbolometer on Silicon
,”
Appl. Phys. Lett.
,
65
, pp.
773
775
.
12.
Kumar
,
A. R.
,
Zhang
,
Z. M.
,
Boychev
,
V. B.
,
Tanner
,
D. B.
,
Vale
,
L. R.
, and
Rudman
,
D. A.
,
1999
, “
Far-Infrared Transmittance and Reflectance of YBa2Cu3O7−δ Films on Si Substrates
,”
ASME J. Heat Transfer
,
121
, pp.
844
851
.
13.
Sanderson
,
R. B.
, and
Scott
,
H. E.
,
1971
, “
High Resolution Far Infrared Interferometer
,”
Appl. Opt.
,
10
, pp.
1097
1102
.
14.
Kumar
,
A. R.
,
Zhang
,
Z. M.
,
Boychev
,
V. B.
, and
Tanner
,
D. B.
,
1999
, “
Temperature-Dependent Far-Infrared Absorptance of Thin YBa2Cu3O7−δ Films in the Normal State
,”
Microscale Thermophys. Eng.
,
3
, pp.
5
15
.
15.
Tanner, D. B., and Timusk, T., 1992, “Optical Properties of High-Temperature Superconductors,” Physical Properties of High-Temperature Superconductors, Vol. 3, D. M. Ginsberg, ed., World Scientific Publishing, Singapore, pp. 363–469.
16.
Zhang
,
Z. M.
,
Kumar
,
A. R.
,
Boychev
,
V. B.
,
Tanner
,
D. B.
,
Vale
,
L. R.
, and
Rudman
,
D. A.
,
1998
, “
Back-Side Reflectance of High Tc Superconducting Thin Films in the Far Infrared
,”
Appl. Phys. Lett.
,
73
, pp.
1907
1909
.
17.
Loewenstein
,
E. V.
,
Smith
,
D. R.
, and
Morgan
,
R. L.
,
1973
, “
Optical Constants of Far-Infrared Materials, 2: Crystalline Solids
,”
Appl. Opt.
,
12
, pp.
398
406
.
18.
Kumar, A. R., 1999, “Far-Infrared Radiative Properties of Superconducting YBCO Films Deposited on Silicon Substrates,” Ph.D. Dissertation, University of Florida, Gainesville, FL.
19.
Chen
,
G.
, and
Tien
,
C. L.
,
1992
, “
Partial Coherence Theory of Thin Film Radiative Properties
,”
ASME J. Heat Transfer
,
114
, pp.
636
643
.
20.
Zhang, Z. M., 1994, “Optical Properties of Layered Structures for Partially Coherent Radiation,” Proc. Tenth Intl. Heat Transfer Conf., Vol. 2, G. F. Hewitt, ed., Taylor and Francis, London, pp. 177–182.
21.
Grossman
,
E. N.
, and
McDonald
,
D. G.
,
1995
, “
Partially Coherent Transmittance of Dielectric Lamellae
,”
Opt. Eng.
,
34
, pp.
1289
1295
.
22.
Anderson
,
C. F.
, and
Bayazitoglu
,
Y.
,
1996
, “
Radiative Properties of Films Using Partial Coherence Theory
,”
J. Thermophys. Heat Transfer
,
10, pp.
26
32
.
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