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Keywords: contact line
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Journal Articles
Publisher: ASME
Article Type: Research-Article
J. Heat Mass Transfer. July 2020, 142(7): 072103.
Paper No: HT-19-1679
Published Online: June 8, 2020
...Deng Huang; Fang Qian; Wenyao Zhang; Wenbo Li; Rui Chuan; Qiuwang Wang; Cunlu Zhao We present an electromechanical model for the analysis of electrowetting by considering the balance between an electric force and a surface tension force acting on the contact line of three phases, namely the droplet...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. November 2007, 129(11): 1476–1485.
Published Online: March 18, 2007
...Sashidhar S. Panchamgam; Joel L. Plawsky; Peter C. Wayner, Jr. Image analyzing interferometry was used to study the spreading characteristics of an evaporating octane meniscus (purity: 99 + % ) on a quartz surface. The thickness, slope, and curvature profiles in the contact line region...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. December 2006, 128(12): 1266–1275.
Published Online: March 26, 2006
... at steady state for the fluxes studied. With an upstream bulk mixture of 2% octane and 98% pentane, a shear stress due to the gradient of the liquid-vapor interfacial surface tension resulting from distillation controlled fluid flow in the contact line region. The average curvature of the evaporating pseudo...
Journal Articles
Sashidhar S. Panchamgam, Shripad J. Gokhale, Joel L. Plawsky, Sunando DasGupta, Peter C. Wayner,, Jr.
Publisher: ASME
Article Type: Technical Papers
J. Heat Mass Transfer. March 2005, 127(3): 231–243.
Published Online: March 24, 2005
...Sashidhar S. Panchamgam; Shripad J. Gokhale; Joel L. Plawsky; Sunando DasGupta; Peter C. Wayner,, Jr. The thickness and curvature profiles in the contact line region of a moving evaporating thin liquid film of pentane on a quartz substrate were measured for the thickness region, δ<2.5 μm...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Heat Mass Transfer. April 2004, 126(2): 169–178.
Published Online: May 4, 2004
... proportional to the difference between the instantaneous force acting on the curved film and the reference force. Using an augmented Young-Laplace pressure jump model, the effect of the excess free energy at the contact line on the oscillations was demonstrated. Derjaguin , B. V. , Nerpin , S. V...