3D double-vision inspection is very necessary. It has a larger field of view, and can solve the problem of “blind area” for 3D measurement, as proposed by 3D single-vision inspection. At the beginning of this paper, the principle of structured-light based 3D vision inspection is introduced. Then, a method of gaining calibration points for 3D double-vision inspection system is proposed in detail. In order to gain calibration points with high precision, a double-directional photoelectric aiming device is designed as well, and a method for compensating the position-setting error of the aiming device is described. The coordinates of all calibration points are precisely unified in a world coordinate system. The application of RBF (radial basis function) neural network in establishing the inspection model of structured-light based 3D vision is described in detail. Finally, with the use of the calibration points, the inspection model of 3D double-vision based on RBF neural network is successfully established. The model’s training accuracy is 0.078 mm, and the testing accuracy is 0.084 mm.
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August 2003
Technical Papers
3D Double-Vision Inspection Based on Structured Light
Guangjun Zhang, Professor,
Guangjun Zhang, Professor
School of Automation Science and Electrical Engineering, Beijing Univ. of Aeronautics and Astronautics, Beijing 100083, P. R. China
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Zhenzhong Wei, Graduate Research Assistant,
Zhenzhong Wei, Graduate Research Assistant
School of Automation Science and Electrical Engineering, Beijing Univ. of Aeronautics and Astronautics, Beijing 100083, P. R. China
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Xin Li, Graduate Research Assistant
Xin Li, Graduate Research Assistant
School of Automation Science and Electrical Engineering, Beijing Univ. of Aeronautics and Astronautics, Beijing 100083, P. R. China
Search for other works by this author on:
Guangjun Zhang, Professor
School of Automation Science and Electrical Engineering, Beijing Univ. of Aeronautics and Astronautics, Beijing 100083, P. R. China
Zhenzhong Wei, Graduate Research Assistant
School of Automation Science and Electrical Engineering, Beijing Univ. of Aeronautics and Astronautics, Beijing 100083, P. R. China
Xin Li, Graduate Research Assistant
School of Automation Science and Electrical Engineering, Beijing Univ. of Aeronautics and Astronautics, Beijing 100083, P. R. China
Contributed by the Manufacturing Engineering Division for publication in the JOURNAL OF MANUFACTURING SCIENCE AND ENGINEERING. Manuscript received October 2001; Revised July 2002. Associate Editor: E. C. DeMeter.
J. Manuf. Sci. Eng. Aug 2003, 125(3): 617-623 (7 pages)
Published Online: July 23, 2003
Article history
Received:
October 1, 2001
Revised:
July 1, 2002
Online:
July 23, 2003
Citation
Zhang, G., Wei, Z., and Li, X. (July 23, 2003). "3D Double-Vision Inspection Based on Structured Light ." ASME. J. Manuf. Sci. Eng. August 2003; 125(3): 617–623. https://doi.org/10.1115/1.1557292
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