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Marisol Koslowski
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Journal Articles

Machine Learning for Predicting the Critical Yield Stress of High Entropy Alloys

Pau Cutrina Vilalta, Somayyeh Sheikholeslami, Katerine Saleme Ruiz, Xin C. Yee, Marisol Koslowski
Journal: Journal of Engineering Materials and Technology
Article Type: Research Papers
J. Eng. Mater. Technol. April 2021, 143(2): 021005.
Paper No: MATS-20-1115
DOI: https://doi.org/10.1115/1.4048873
Published Online: November 19, 2020
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Topics: Alloys, Dislocations, Entropy, Machine learning, Yield stress, Errors, Dimensions, Engineering simulation, Simulation
Proceedings Papers

Quantification of Uncertainty in Creep Failure in RF-MEMS Switches

Peter A. Kolis, Marisol Koslowski, Anil K. Bajaj
Proc. ASME. IMECE2012, Volume 8: Mechanics of Solids, Structures and Fluids, 635-641, November 9–15, 2012
Paper No: IMECE2012-88160
DOI: https://doi.org/10.1115/IMECE2012-88160
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Topics: Creep, Failure, Microelectromechanical systems, Switches, Uncertainty, Dynamic response, Engineering simulation, Geometry, Microscale devices, Simulation
Proceedings Papers

Finite Volume Method for Simulation of Creep in RF MEMS Devices

Shankhadeep Das, Marisol Koslowski, Sanjay R. Mathur, Jayathi Y. Murthy
Proc. ASME. IMECE2011, Volume 11: Nano and Micro Materials, Devices and Systems; Microsystems Integration, 119-128, November 11–17, 2011
Paper No: IMECE2011-62660
DOI: https://doi.org/10.1115/IMECE2011-62660
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Topics: Creep, Finite volume methods, Microelectromechanical systems, Simulation, Membranes, Actuators, Algebra, Electrodes, Reliability, Solids
Proceedings Papers

Interface Effects in Strained Thin Films

Andrew Robison, Lei Lei, Sowmya Ramarapu, Marisol Koslowski
Proc. ASME. IMECE2009, Volume 12: Micro and Nano Systems, Parts A and B, 71-75, November 13–19, 2009
Paper No: IMECE2009-12539
DOI: https://doi.org/10.1115/IMECE2009-12539
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Topics: Thin films, Dislocations, Crystals, Film thickness, Metallic thin films, Optoelectronic devices, Semiconductor industry, Thread