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Proceedings Papers

Constrained Layer Damping Treatments for Microstructures

Yi-Chu Hsu, I. Y. Shen
Proc. ASME. IMECE2001, Micro-Electro-Mechanical Systems (MEMS), 807-812, November 11–16, 2001
Paper No: IMECE2001/MEMS-23915
https://doi.org/10.1115/IMECE2001/MEMS-23915
View Paper titled, Constrained Layer Damping Treatments for Microstructures
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Topics: Damping, Microelectromechanical systems, Silicon, Aluminum, Etching, Photoresists, Excitation, Finite element analysis, Frequency response, Laser Doppler vibrometers
Proceedings Papers

Inertance Effects to Diffuser Micropumps Flow Rate Spectrum

Ngoc-Bich Le, Mau-Sheng Lin, Yi-Chu Hsu, Ling-Sheng Jang
Proc. ASME. MNHT2008, ASME 2008 First International Conference on Micro/Nanoscale Heat Transfer, Parts A and B, 87-96, June 6–9, 2008
Paper No: MNHT2008-52047
https://doi.org/10.1115/MNHT2008-52047
View Paper titled, Inertance Effects to Diffuser Micropumps Flow Rate Spectrum
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Topics: Diffusers, Flow (Dynamics), Fluids, Micropumps
Proceedings Papers

Active Vibration Control of Meso- and Microstructures via Piezoelectric Films

Yi-Chu Hsu, Chia-Che Wu, G. Z. Cao, I. Y. Shen
Proc. ASME. IDETC-CIE2003, Volume 5: 19th Biennial Conference on Mechanical Vibration and Noise, Parts A, B, and C, 1955-1961, September 2–6, 2003
Paper No: DETC2003/VIB-48540
https://doi.org/10.1115/DETC2003/VIB-48540
View Paper titled, Active Vibration Control of Meso- and Microstructures via Piezoelectric Films
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Topics: Vibration control, Thick films, Cantilevers, Silicon, Electrodes, Actuators, Control equipment, Dimensions, Fracture (Materials), Frequency response
Journal Articles

Constrained Layer Damping Treatments for Microstructures

Yi-Chu Hsu, Graduate Student, I. Y. Shen, Associate Professor
Journal: Journal of Vibration and Acoustics
Article Type: Technical Papers
J. Vib. Acoust. October 2002, 124(4): 612–616.
https://doi.org/10.1115/1.1500743
Published Online: September 20, 2002
View Article titled, Constrained Layer Damping Treatments for Microstructures
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Topics: Damping, Finite element analysis, Resonance, Vibration, Silicon, Aluminum, Photoresists, Micromachining, Semiconductor wafers