Thermosonic ball bonding is the method of choice for many interconnections to integrated circuits. This study investigated the effects of bonding parameters on bonding strength using a thermosonic bonding machine and a shear tester. Theoretical analyses were conducted to relate bonding strength to interfacial contact phenomena. Our results show that bonding strength of thermosonic wire bonds can be explained based on frictional energy intensity and real contact area. When the ultrasonic power is small, the bonding strength increases with increasing real contact area mainly caused by the bonding force. Increasing the bonding force can hardly increase the frictional energy intensity, but it can increase the real contact area, thus increasing the shear force. For larger ultrasonic power, the ultrasonic power plays an important role in increasing the bonding strength at the interface between the wire and the pad. Increasing the ultrasonic power increases both the frictional energy intensity and the real contact area, thus increasing the shear force until before the frictional energy intensity reaches a critical point. Moreover, increasing the welding time increases both the frictional energy intensity and the real contact area, thus increasing the shear force before the critical frictional energy intensity is attained; this is far smaller than the critical frictional energy intensity when the ultrasonic power is varied.
Skip Nav Destination
Article navigation
July 2003
Technical Papers
Study of Interfacial Phenomena Affecting Thermosonic Wire Bonding in Microelectronics
Yeau-Ren Jeng, Professor,
Yeau-Ren Jeng, Professor
Department of Mechanical Engineering, National Chung Cheng University, Chia-Yi 621, Taiwan
Search for other works by this author on:
Jeng-Nan Lin, Graduate Student
Jeng-Nan Lin, Graduate Student
Department of Mechanical Engineering, National Chung Cheng University, Chia-Yi 621, Taiwan
Search for other works by this author on:
Yeau-Ren Jeng, Professor
Department of Mechanical Engineering, National Chung Cheng University, Chia-Yi 621, Taiwan
Jeng-Nan Lin, Graduate Student
Department of Mechanical Engineering, National Chung Cheng University, Chia-Yi 621, Taiwan
Contributed by the Tribology Division for publication in the ASME JOURNAL OF TRIBOLOGY. Manuscript received by the Tribology Division May 17, 2002 revised manuscript received August 20, 2002. Associate Editor: C.-P. R. Ku.
J. Tribol. Jul 2003, 125(3): 576-581 (6 pages)
Published Online: June 19, 2003
Article history
Received:
May 17, 2002
Revised:
August 20, 2002
Online:
June 19, 2003
Citation
Jeng, Y., and Lin, J. (June 19, 2003). "Study of Interfacial Phenomena Affecting Thermosonic Wire Bonding in Microelectronics ." ASME. J. Tribol. July 2003; 125(3): 576–581. https://doi.org/10.1115/1.1537265
Download citation file:
Get Email Alerts
Related Articles
A Microcontact Approach for Ultrasonic Wire Bonding in Microelectronics
J. Tribol (October,2001)
On an Elastic Circular Inhomogeneity With Imperfect Interface in Antiplane Shear
J. Appl. Mech (September,2002)
Elastohydrodynamic Lubrication: A Gateway to Interfacial Mechanics—Review and Prospect
J. Tribol (October,2011)
Related Proceedings Papers
Related Chapters
Introduction
Ultrasonic Welding of Lithium-Ion Batteries
Synthesis and Characterization of Carboxymethyl Chitosan Based Hybrid Biopolymer Scaffold
International Conference on Mechanical and Electrical Technology, 3rd, (ICMET-China 2011), Volumes 1–3
Concluding Remarks and Future Work
Ultrasonic Welding of Lithium-Ion Batteries